Dielectric response of different complex materials

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 19, Issue 4, 2012, Pages 1344-1350

  Nigmatullin, Raoul R ^a   Zhang, Wei ^b   Baleanu, Dumitru ^c,d  

^a KAZAN FEDERAL UNIVERSITY   (Russian Federation)

^b JINAN UNIVERSITY   (China)

^c CANKAYA UNIVERSITY   (Turkey)

^d INSTITUTE OF SPACE SCIENCES   (Romania)

Author keywords

Dielectric materials; dielectric measurements; methods of SN analysis

Indexed keywords

AMPLITUDE-FREQUENCY; COMPLEX MATERIALS; DIELECTRIC MEASUREMENTS; DIELECTRIC RESPONSE; ELECTROMAGNETIC RESPONSE; METHODS OF SN ANALYSIS; METROLOGICAL PARAMETERS; NON-ORTHOGONAL; PHYSICAL MODEL; QUANTITATIVE CHARACTERISTICS;

ELECTRIC INSULATION; MATERIALS PROPERTIES;

DIELECTRIC MATERIALS;

EID: 84864951985     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2012.6260010     Document Type: Article

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