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Volumn 14, Issue 9, 2012, Pages

A new certified reference material for size analysis of nanoparticles

Author keywords

Certified reference material; Particle size analysis; Quality assurance; Quality control; Silica nanoparticles

Indexed keywords

COLLOIDS; DYNAMIC LIGHT SCATTERING; NANOPARTICLES; PARTICLE SIZE; PARTICLE SIZE ANALYSIS; QUALITY ASSURANCE; SILICA; SILICA NANOPARTICLES;

EID: 84864911138     PISSN: 13880764     EISSN: 1572896X     Source Type: Journal    
DOI: 10.1007/s11051-012-1021-3     Document Type: Article
Times cited : (25)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.