Voltage drops, sawtooth oscillations and HF bursts in breakdown current and voltage waveforms during UIS experiments

Proceedings of the International Symposium on Power Semiconductor Devices and ICs

Volumn , Issue , 2012, Pages 165-168

  Irace, A ^a   Spirito, P ^a   Riccio, M ^a   Breglio, G ^a  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

Author keywords

Avalanche Breakdown; Current filamentation; Infrared Thermography; Negative Differential Resistance

Indexed keywords

AVALANCHE BREAKDOWN; BREAKDOWN CURRENTS; CURRENT CONDUCTION; CURRENT FILAMENTATION; CURRENT WAVEFORMS; DEVICE FAILURES; DEVICE RELIABILITY; HIGH CURRENTS; NEGATIVE DIFFERENTIAL RESISTANCES; SAWTOOTH OSCILLATIONS; VOLTAGE DROP; VOLTAGE WAVEFORMS;

THERMOGRAPHY (IMAGING);

PLASMA OSCILLATIONS;

EID: 84864768131     PISSN: 10636854     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISPSD.2012.6229049     Document Type: Conference Paper

References (4)

1. K.Fischer et al., "Dynamics of power MOSFET switching under unclamped inductive loading conditions", IEEE Transaction on Electron Devices, 43 (6), 1007-1015, 1996.
2. M. Riccio et al., Analysis of large area Trench-IGBT current distribution under UIS test with the aid of lock-in thermography, Microelectronics Reliability, 30, 1725-1730, 2010
3. S.T. Fisher, "Small-signal impedance of avalanching junctions with unequal electron and hole ionization rates and drift velocities" IEEE Transaction on Electron Devices,14 (6), 313-322, 1967.
4. T. Misawa, "Negative resistance in p-n junctions under avalanche breakdown conditions", IEEE Transaction on Electron Devices", 13 (1), 137-143, 1966