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Volumn 101, Issue 5, 2012, Pages

Dc illusion and its experimental verification

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTING MATERIALS; DIELECTRIC OBJECTS; EXPERIMENTAL VERIFICATION; MEASUREMENT DATA; METAL FILM; METALLIC OBJECTS; POTENTIAL APPLICATIONS; RESISTOR NETWORK; TRANSFORMATION OPTICS;

EID: 84864644432     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4742133     Document Type: Article
Times cited : (52)

References (24)
  • 7
    • 84855280092 scopus 로고    scopus 로고
    • 10.1002/adma.201104012
    • S. Narayana and Y. Sato, Adv. Mater. 24, 71 (2012). 10.1002/adma. 201104012
    • (2012) Adv. Mater. , vol.24 , pp. 71
    • Narayana, S.1    Sato, Y.2
  • 17
    • 79952515753 scopus 로고    scopus 로고
    • 10.1103/PhysRevE.83.026601
    • W. X. Jiang and T. J. Cui, Phys. Rev. E 83, 026601 (2011). 10.1103/PhysRevE.83.026601
    • (2011) Phys. Rev. e , vol.83 , pp. 026601
    • Jiang, W.X.1    Cui, T.J.2
  • 19
    • 77749344709 scopus 로고    scopus 로고
    • 10.1364/OE.18.005161
    • W. X. Jiang and T. J. Cui, Opt. Express 18, 5161 (2010). 10.1364/OE.18.005161
    • (2010) Opt. Express , vol.18 , pp. 5161
    • Jiang, W.X.1    Cui, T.J.2
  • 23
    • 67649382486 scopus 로고    scopus 로고
    • 10.1016/S0079-6638(08)00202-3
    • U. Leonhardt and T. G. Philbin, Prog. Opt. 53, 69 (2009). 10.1016/S0079-6638(08)00202-3
    • (2009) Prog. Opt. , vol.53 , pp. 69
    • Leonhardt, U.1    Philbin, T.G.2
  • 24
    • 84864696825 scopus 로고    scopus 로고
    • See supplementary material at E-APPLAB-101-066232 for additional figures, resistors used in the simulation and fabrication, and originally measured data.
    • See supplementary material at http://dx.doi.org/10.1063/1.4742133 E-APPLAB-101-066232 for additional figures, resistors used in the simulation and fabrication, and originally measured data.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.