Technical note: Examination of focused ion beam-sectioned surface films formed on am60b mg alloy in an aqueous saline solution

Corrosion

Volumn 68, Issue 6, 2012, Pages 468-474

  Kish, J R ^a   Hu, Y ^a   Li, J ^b   Zheng, W ^b   McDermid, J R ^a  

^a MCMASTER UNIVERSITY   (Canada)

^b CANMET MATERIALS TECHNOLOGY LABORATORY   (Canada)

Author keywords

Chloride; Corrosion; Depassivation; Film; Localized attack; Scanning electron microscopy

Indexed keywords

BREAKDOWN POTENTIAL; CHEMICAL CHANGE; CHEMICAL NATURE; CHLORIDE; CRACKED FILMS; CROSS SECTION; DEPASSIVATION; FOCUSED ION BEAM MILLING; LOCALIZED ATTACK; LOCALIZED CORROSION; MG ALLOY; PHYSICAL CHANGES; POTENTIODYNAMIC ANODIC POLARIZATION; SALINE SOLUTIONS; SEM-EDS; SURFACE FILMS; TECHNICAL NOTES;

ALUMINUM CORROSION; ANODIC POLARIZATION; CHLORINE; CHLORINE COMPOUNDS; CORROSION; ENERGY DISPERSIVE SPECTROSCOPY; FILMS; SCANNING ELECTRON MICROSCOPY;

FOCUSED ION BEAMS;

EID: 84864592530     PISSN: 00109312     EISSN: None     Source Type: Journal    
DOI: 10.5006/i0010-9312-68-6-468     Document Type: Article

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