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Volumn 8, Issue 23, 2012, Pages 6301-6309
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Advancing modes on regularly patterned substrates
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Author keywords
[No Author keywords available]
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Indexed keywords
ADVANCING CONTACT ANGLE;
APPARENT CONTACT ANGLE;
CENTER DISTANCE;
CIRCULAR POSTS;
CONTACT LINES;
CONTROL PARAMETERS;
DEPINNING;
HOMOGENEOUS MATERIALS;
INTERFACIAL CONFIGURATIONS;
INTERFACIAL INSTABILITY;
INTERFACIAL MORPHOLOGIES;
LIQUID INTERFACE;
MECHANICALLY STABLE;
MICROSTRUCTURED SUBSTRATES;
PATTERNED SUBSTRATES;
PERIODIC ARRAYS;
THREE-PHASE CONTACT LINE;
ASPECT RATIO;
COALESCENCE;
CONTACT ANGLE;
SUBSTRATES;
LIQUIDS;
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EID: 84864512311
PISSN: 1744683X
EISSN: 17446848
Source Type: Journal
DOI: 10.1039/c2sm25156f Document Type: Article |
Times cited : (36)
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References (23)
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