Amorphization and disorder of PrFeO 3 thin films after heavy ion irradiation

Applied Radiation and Isotopes

Volumn 70, Issue 10, 2012, Pages 2409-2415

  Mir, Feroz Ahmad ^a   Ikram, M ^a   Kumar, Ravi ^b  

^a NATIONAL INSTITUTE OF TECHNOLOGY   (India)

^b NATIONAL INSTITUTE OF TECHNOLOGY   (India)

Author keywords

Grain size; Optical band gap; Pulsed laser deposition technique; Raman modes; Strain; X ray diffraction

Indexed keywords

BOND ANGLE; FLUENCES; GRAIN SIZE; ION FLUENCES; OCTAHEDRAL DISTORTION; ORTHORHOMBIC STRUCTURES; PULSED-LASER DEPOSITION TECHNIQUE; RAMAN MODES; RAMAN SHIFT; RAMAN STUDIES; ROOM TEMPERATURE; SPACE GROUPS; SUBSTRATE-INDUCED STRAIN; UV-VISIBLE SPECTRA; X-RAY DIFFRACTION STUDIES;

FILM THICKNESS; GRAIN SIZE AND SHAPE; IRON OXIDES; OPTICAL BAND GAPS; PULSED LASER DEPOSITION; STRAIN; X RAY DIFFRACTION;

THIN FILMS;

HEAVY ION; PEROVSKITE; PRISTINE; UNCLASSIFIED DRUG;

ANALYTIC METHOD; ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL ANALYSIS; CHEMICAL BOND; CHEMICAL STRUCTURE; CRYSTALLIZATION; FILM; IRRADIATION; MAGNETISM; MORPHOLOGY; PRIORITY JOURNAL; PULSED LASER DEPOSITION TECHNIQUE; RAMAN SPECTROMETRY; SURFACE PROPERTY; X RAY DIFFRACTION;

EID: 84864509625     PISSN: 09698043     EISSN: 18729800     Source Type: Journal    
DOI: 10.1016/j.apradiso.2012.06.002     Document Type: Article

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