SCOPUS 정보 검색 플랫폼

Surface and Interface Analysis

Volumn 44, Issue 8, 2012, Pages 986-988

Combined XPS and first principle study of metastable Mg-Ti thin films

(5) Jensen, I J T a Lovvik O M a,b Schreuders, H c Dam, B c Diplas, S a,b

a UNIVERSITY OF OSLO (Norway)

b SINTEF MATERIALS AND CHEMISTRY (Norway)

c DELFT UNIVERSITY OF TECHNOLOGY (Netherlands)

Author keywords

density of states; DFT; metastable; thin films; valence; XPS

Indexed keywords

ATOMIC DISTRIBUTION; ATOMISTIC MODELS; DENSITY FUNCTIONAL THEORY CALCULATIONS; DENSITY OF STATE; DFT; DFT CALCULATION; FIRST-PRINCIPLE STUDY; METASTABLE; SHORT RANGE ORDERS; SMALL CLUSTERS; SPUTTERED THIN FILMS; VALENCE; VALENCE BAND SPECTRA;

DENSITY FUNCTIONAL THEORY; NANOCLUSTERS; PHOTOELECTRONS; STOICHIOMETRY; THIN FILMS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84864492472 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.4847 Document Type: Conference Paper

Times cited : (6)

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