Downwards inference: Bayesian analysis of overlapping higher-level data sets of complex binary-state on-demand systems

Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability

Volumn 226, Issue 2, 2012, Pages 182-193

  Jackson, C ^a   Mosleh, A ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

Bayesian analysis; downwards inference; on demand systems; overlapping hierarchical data

Indexed keywords

BAYESIAN ANALYSIS; BAYESIAN APPROACHES; COMPONENT FAILURES; COMPONENT STATE; DATA SETS; DOWNWARDS INFERENCE; FAULT-TREES; HIERARCHICAL DATA; LIKELIHOOD FUNCTIONS; ON-DEMAND SYSTEMS; OVERLAPPING DATA; RELIABILITY BLOCK DIAGRAMS; SENSOR LOCATION; STATE VECTOR; STRUCTURE FUNCTIONS; SYSTEM STATE;

BAYESIAN NETWORKS;

EID: 84864428713     PISSN: 1748006X     EISSN: 17480078     Source Type: Journal    
DOI: 10.1177/1748006X11402423     Document Type: Conference Paper

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