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Volumn 37, Issue 14, 2012, Pages 2961-2963

Polarization resolved reflection from ordered vertical silicon nanowire arrays

Author keywords

[No Author keywords available]

Indexed keywords

EFFECTIVE MEDIUM APPROXIMATION; ELLIPSOMETRIC ANALYSIS; EXPERIMENTAL DATA; POLARIZATION-RESOLVED REFLECTIONS; RIGOROUS COUPLED WAVE ANALYSIS; SILICON NANOWIRE ARRAYS;

EID: 84864359674     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.37.002961     Document Type: Article
Times cited : (7)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.