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Volumn 229, Issue , 2012, Pages 51-60
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TiO 2 nanoparticle layer formation on ceramic support, a statistical approach to control influential synthesis parameters
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Author keywords
Photocatalytic degradation; Synthesis parameters; TiO 2 nanopowder; TiO 2 thin film; Volatile organic compounds
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Indexed keywords
ANATASE PHASE;
BRUNAUER-EMMETT-TELLER TECHNIQUES;
CALCINATION TEMPERATURE;
CALCINATION TIME;
CERAMIC SUPPORTS;
COATED FILMS;
CRYSTALLINE PHASE;
CRYSTALLINITIES;
GASPHASE;
GEL CONTENTS;
GEL PRODUCTS;
MOLAR RATIO;
NANO POWDERS;
NANOPARTICLE LAYERS;
NANOSIZED TIO;
OPTIMAL SYNTHESIS;
PHOTO CATALYTIC DEGRADATION;
PHOTO-CATALYTIC;
PHOTOCATALYTIC ACTIVITIES;
POWDER SAMPLES;
REFLUXING;
REFLUXING TEMPERATURES;
RELATIVE CRYSTALLINITY;
STATISTICAL APPROACH;
SURFACE AREA;
SYNTHESIS PARAMETERS;
TIO;
ULTRA-FINES;
UV IRRADIATION;
ALDEHYDES;
ALUMINA;
BATCH REACTORS;
CALCINATION;
CRYSTALLITE SIZE;
NANOPARTICLES;
OPTIMIZATION;
PHOTOCATALYSIS;
PHOTODEGRADATION;
SCANNING ELECTRON MICROSCOPY;
SOL-GEL PROCESS;
SPECIFIC SURFACE AREA;
SURFACE ACTIVE AGENTS;
SYNTHESIS (CHEMICAL);
THIN FILMS;
VOLATILE ORGANIC COMPOUNDS;
X RAY DIFFRACTION;
TITANIUM DIOXIDE;
ACETALDEHYDE;
NANOPARTICLE;
SURFACTANT;
TITANIUM DIOXIDE;
ARTICLE;
BRUNAUER EMMETT TELLER TECHNIQUE;
CONCENTRATION (PARAMETERS);
CONTROLLED STUDY;
CRYSTALLIZATION;
FILM;
INVESTIGATIVE PROCEDURES;
MATERIAL COATING;
MATHEMATICAL MODEL;
NANOFABRICATION;
PARTICLE SIZE;
PHOTOCATALYSIS;
PROCESS OPTIMIZATION;
QUANTITATIVE ANALYSIS;
SCANNING ELECTRON MICROSCOPY;
STATISTICAL ANALYSIS;
SURFACE PROPERTY;
X RAY DIFFRACTION;
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EID: 84864308963
PISSN: 00325910
EISSN: 1873328X
Source Type: Journal
DOI: 10.1016/j.powtec.2012.06.004 Document Type: Article |
Times cited : (12)
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References (18)
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