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Volumn 171-172, Issue , 2012, Pages 544-549

O 2-exposure and light-irradiation properties of picene thin film field-effect transistor: A new way toward O 2 gas sensor

Author keywords

Light irradiation; O 2 gas sensor; Organic thin film FET; Picene; Pulse bias application

Indexed keywords

BIAS STRESS; GAS SENSING; GAS SENSING PROPERTIES; GATE VOLTAGES; LIGHT IRRADIATIONS; LOW VOLTAGE OPERATION; ORGANIC THIN FILMS; PICENE; SENSING MECHANISM; SENSING PROPERTY; TIO; TRANSISTOR CHARACTERISTICS;

EID: 84864283800     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2012.05.030     Document Type: Article
Times cited : (21)

References (16)
  • 2
    • 59349117570 scopus 로고    scopus 로고
    • Trap states and transport characteristics in picene thin film field-effect transistor
    • N. Kawasaki, Y. Kubozono, H. Okamoto, A. Fujiwara, and M. Yamaji Trap states and transport characteristics in picene thin film field-effect transistor Applied Physics Letters 94 2009 043310
    • (2009) Applied Physics Letters , vol.94 , pp. 043310
    • Kawasaki, N.1    Kubozono, Y.2    Okamoto, H.3    Fujiwara, A.4    Yamaji, M.5
  • 11
    • 32444436987 scopus 로고    scopus 로고
    • Evidence of water-related discrete trap state formation in pentacene single-crystal field-effect transistors
    • C. Goldmann, D.J. Gundlach, and B. Batlogg Evidence of water-related discrete trap state formation in pentacene single-crystal field-effect transistors Applied Physics Letters 88 2006 063501
    • (2006) Applied Physics Letters , vol.88 , pp. 063501
    • Goldmann, C.1    Gundlach, D.J.2    Batlogg, B.3
  • 12
    • 33645502724 scopus 로고    scopus 로고
    • Determination of the interface trap density of rubrene single-crystal field-effect transistors and comparison to the bulk trap density
    • C. Goldmann, C. Krellner, K.P. Pernstich, S. Haas, D.J. Gundlach, and B. Batlogg Determination of the interface trap density of rubrene single-crystal field-effect transistors and comparison to the bulk trap density Journal of Applied Physics 99 2006 034507
    • (2006) Journal of Applied Physics , vol.99 , pp. 034507
    • Goldmann, C.1    Krellner, C.2    Pernstich, K.P.3    Haas, S.4    Gundlach, D.J.5    Batlogg, B.6
  • 14
    • 33847658220 scopus 로고    scopus 로고
    • Organic small molecule field-effect transistors with Cytop™ gate dielectric: Eliminating gate bias stress effects
    • W.L. Kalb, T. Mathis, S. Haas, A.F. Strassen, and B. Batlogg Organic small molecule field-effect transistors with Cytop™ gate dielectric: eliminating gate bias stress effects Applied Physics Letters 90 2007 092104
    • (2007) Applied Physics Letters , vol.90 , pp. 092104
    • Kalb, W.L.1    Mathis, T.2    Haas, S.3    Strassen, A.F.4    Batlogg, B.5
  • 16
    • 24344488483 scopus 로고    scopus 로고
    • Photoinduced doping effect of pentacene field effect transistor in oxygen atmosphere studied by displacement current measurement
    • S. Ogawa, T. Naijo, Y. Kimura, H. Ishii, and M. Niwano Photoinduced doping effect of pentacene field effect transistor in oxygen atmosphere studied by displacement current measurement Applied Physics Letters 86 2005 252104
    • (2005) Applied Physics Letters , vol.86 , pp. 252104
    • Ogawa, S.1    Naijo, T.2    Kimura, Y.3    Ishii, H.4    Niwano, M.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.