Short-circuit ruggedness of high-voltage IGBTs

2012 28th International Conference on Microelectronics - Proceedings, MIEL 2012

Volumn , Issue , 2012, Pages 243-250

  Lutz, J ^a   Basler, T ^a  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DESTRUCTIVE MEASUREMENTS; FAILURE PATTERNS; FILAMENT FORMATION; GATE DRIVES; HIGH-VOLTAGES; PARASITIC ELEMENT; SHORT-CIRCUIT CONDITIONS; SHORT-CIRCUIT PROTECTION;

MICROELECTRONICS;

EID: 84864208527     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MIEL.2012.6222845     Document Type: Conference Paper

References (19)

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