Optical measurement of directional strain by scattering from nano-disk pairs aligned on an elastomer

Nanotechnology

Volumn 23, Issue 31, 2012, Pages

  Kan, Tetsuo ^a   Matsumoto, Kiyoshi ^a   Shimoyama, Isao ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AXIAL DIRECTION; COMPRESSION STRAIN; GAP DISTANCES; IN-SITU; NANOMETRIC SCALE; NANOPARTICLE PAIRS; OPTICAL MEASUREMENT; PEAK WAVELENGTH; POLARIZATION ANGLE; POLYDIMETHYLSILOXANE PDMS; SCATTERING SPECTRA; SCATTERING WAVELENGTHS; WIRELESS MEASUREMENTS;

ELASTOMERS; OPTICAL DATA PROCESSING; SCATTERING; SILICONES; WAVELENGTH;

TENSILE STRAIN;

EID: 84863970506     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/23/31/315201     Document Type: Article

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