Doubly localized surface plasmon resonance in bimodally distributed silver nanoparticles

Journal of Nanoscience and Nanotechnology

Volumn 12, Issue 6, 2012, Pages 4540-4545

  Ranjan, M ^a  

^a INSTITUTE FOR PLASMA RESEARCH   (India)

Author keywords

Bimodal Distribution; Ellpsometry; LSPR; Magnetron Sputtering; PVD; Silver Nanoparticles

Indexed keywords

ADSORBED OXYGEN; BIMODAL DISTRIBUTION; BIMODAL SIZE DISTRIBUTION; DEPOSITION TIME; ELLPSOMETRY; GROWTH CONDITIONS; HEATED SUBSTRATES; LOCALIZED SURFACE PLASMON RESONANCE; LORENTZ OSCILLATOR MODEL; LSPR; PHYSICAL VAPOUR DEPOSITION; PLASMA FREQUENCIES; PLASMON RESONANCES; REDEPOSITION; SILVER NANOPARTICLES; SILVER SURFACE; SURFACE FREE ENERGY; VACUUM-ANNEALING;

INTERFACIAL ENERGY; MAGNETRON SPUTTERING; NANOPARTICLES; OXYGEN; PHYSICAL VAPOR DEPOSITION; PHYSISORPTION; PLASMA WAVES; SURFACE PLASMON RESONANCE; VACUUM;

SILVER;

METAL NANOPARTICLE; NANOMATERIAL; SILVER;

ARTICLE; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; CONFORMATION; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; OSCILLOMETRY; PARTICLE SIZE; SURFACE PLASMON RESONANCE; SURFACE PROPERTY; ULTRASTRUCTURE;

COMPUTER SIMULATION; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; METAL NANOPARTICLES; MODELS, CHEMICAL; MOLECULAR CONFORMATION; NANOSTRUCTURES; OSCILLOMETRY; PARTICLE SIZE; SILVER; SURFACE PLASMON RESONANCE; SURFACE PROPERTIES;

EID: 84863940295     PISSN: 15334880     EISSN: 15334899     Source Type: Journal    
DOI: 10.1166/jnn.2012.6217     Document Type: Article

References (25)

1. A. Pinchuk, A. Hilger, G. V. Plessen, and U. Kreibig, Nanotechnology 15, 1890 (2004).
2. J. S. Schilkraut, Appl. Opt. 27, 4587 (1998).
3. K. Matsubara, S. Kawata, and N. Minami, Appl. Opt. 27, 1160 (1998).
4. R. K. Roy, S. K. Mandal, D. Bhattacharya, and A. K. Pal, Eur. Phys. J. B 34, 25 (2003).
5. S. Pillai, K. R. Catchpole, T. Trupke, and M. A. Green, J. Appl. Phys. 101, 093105 (2007).
6. T. Arai, P. K. R. Kumar, C. Rockstuhl, K. Awazu, and J. Tominaga, J. Opt. A: Pure Appl. Opt. 9, 699 (2007).
7. D. D. Evanoff and G. Chumanov, Chem. Phys. Chem. 6, 1221 (2005).
8. U. Kreibig and M. Vollmer, Optical Properties of Metal Clusters, Springer Series in Material Science, Berlin (1993).
9. D. Bedeaux and J. Vlieger, Optical Properties of Surfaces, Imperical College Press, London (2002).
10. H. Fujiwara, Spectroscopic Ellipsometry Principles and Applications, John Wiley and Sons Ltd., England (2007).
11. T. W. H. Oates and A. Mucklich, Nanotechnology 16, 2606 (2005).
12. T. W. H. Oates, Appl. Phys. Lett. 88, 213115 (2006).
13. H. Wormeester and E. S. Kooij, Thin Solid Films 455, 323 (2004).
14. H. Wormeester and E. S. Kooij, J. Chem. Phys. 124, 204713 (2006).
15. R. Gupta, M. J. Dyer, and W. A. Weimer, J. Appl. Phys. 92, 5264 (2002).
16. T. W. H. Oates, M. Ranjan, S. Facsko, and H. Arwin, Opti. Express. 19, 2014 (2011).
17. X. Chen, B. Jia, J. K. Saha, B. Cai, N. Stokes, Q. Qiao, Y. Wang, Z. Shi, M. Gu, Nano Lett. 12, 2187 (2012).
18. J. Hu, W. Cai, C. Li, Y. Gan, and L. Chen, Appl. Phys. Lett. 86, 151915 (2005).
19. K. K. Nanda, A. Maisels, F. E. Kruis, H. Fissan, and S. Stappert, Phys. Rev. Lett. 91, 106102 (2003).
20. M. Ranjan, S. Facsko, M. Fritzsche, and S. Mukherjee, Microelectron. Eng. doi:10.1016/j.mee.2012.02.018 (2012).
21. K. Chatterjee, S. Banerjee, and D. Chakravorty, Phys. Rev. B 66, 085421 (2002).
22. R. L. Chern, X. X. Liu, and C. C. Chang, Phys. Rev. E 76, 016609 (2007).
23. J. R. Krenn, G. Schider, W. Rechberger, B. Lamprecht, A. Leitner, and F. R. Aussenegg, Appl. Phys. Lett. 77, 3379 (2002).
24. R. H. Magruder, S. J. Robinson, C. Smith, A. Meldrum, A. Halabica, and R. F. Haglund, J. Appl. Phys. 105, 02430 (2005).
25. S. M. Kim, K. S. Park, K. D. Kim, S. D. Park, and H. T. Kim, J. Ind. Eng. Chem. 15, 894 (2009).