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Journal of Materials Chemistry

Volumn 22, Issue 31, 2012, Pages 16060-16065

Abnormal behaviors in electrical transport properties of cobalt-doped tin oxide thin films

(4) Jiang, Yinzhu a Li, Yong a Yan, Mi a Bahlawane, Naoufal b

a ZHEJIANG UNIVERSITY (China)

b BIELEFELD UNIVERSITY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABNORMAL BEHAVIOR; ABNORMAL CHANGE; COBALT DOPING; DOPING STRATEGIES; ELECTRICAL RESISTIVITY; ELECTRICAL TRANSPORT; ELECTRICAL TRANSPORT PROPERTIES; INTERSTITIALS; PHYSIO-CHEMICAL PROPERTIES; POST ANNEALING TREATMENT; SPRAY EVAPORATION; TIN OXIDE THIN FILM;

CHEMICAL VAPOR DEPOSITION; ELECTRIC CONDUCTIVITY; SEMICONDUCTOR DOPING; THIN FILMS; TIN; TIN OXIDES; TRANSPORT PROPERTIES;

COBALT;

EID: 84863900287 PISSN: 09599428 EISSN: 13645501 Source Type: Journal
DOI: 10.1039/c2jm32801a Document Type: Article

Times cited : (25)

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