Characterization of the oxygen ionosorption effect on a single SnO 2 nanowire by using conductive atomic force microscopy

Journal of Nanoscience and Nanotechnology

Volumn 12, Issue 6, 2012, Pages 4864-4867

  Heo, Jinhee ^a   Lee, Junghwan ^a  

^a Korea Institute of Material Science   (South Korea)

Author keywords

Conductive AFM; Gas Sensor; Nanowire; Scanning Probe Microscopy (SPM); Tin Oxide (SnO 2)

Indexed keywords

AU THIN FILMS; CONDUCTIVE ATOMIC FORCE MICROSCOPY; CONDUCTIVE-AFM; I - V CURVE; N-TYPE SEMICONDUCTORS; P-TYPE; SCHOTTKY; THERMAL PROCESS; TIN-OXIDE (SNO 2);

ATOMIC FORCE MICROSCOPY; CHEMICAL SENSORS; TIN;

NANOWIRES;

NANOMATERIAL; OXYGEN; TIN DERIVATIVE; TIN DIOXIDE;

ABSORPTION; ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; CONDUCTOMETRY; ELECTRIC CONDUCTIVITY; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; ULTRASTRUCTURE;

ABSORPTION; CONDUCTOMETRY; ELECTRIC CONDUCTIVITY; MATERIALS TESTING; MICROSCOPY, ATOMIC FORCE; NANOSTRUCTURES; OXYGEN; PARTICLE SIZE; TIN COMPOUNDS;

EID: 84863895414     PISSN: 15334880     EISSN: 15334899     Source Type: Journal    
DOI: 10.1166/jnn.2012.4913     Document Type: Article

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