Thermal rectification in graded materials

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 86, Issue 1, 2012, Pages

  Wang, Jiao ^a   Pereira, Emmanuel ^b   Casati, Giulio ^c,d,e  

^a XIAMEN UNIVERSITY   (China)

^b FEDERAL UNIVERSITY OF MINAS GERAIS   (Brazil)

^c UNIVERSITY OF INSUBRIA   (Italy)

^d E CNR INFM ^*  (Italy)

^e INFN SEZIONE DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

BASIC CONDITIONS; GRADED MATERIALS; MASS DISTRIBUTION; THERMAL DIODES;

CONDENSED MATTER PHYSICS;

PHYSICS;

EID: 84863893987     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.86.010101     Document Type: Article

References (22)

1. M. Terraneo, M. Peyrard, and G. Casati, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.88.094302 88, 094302 (2002).
2. B. Li, L. Wang, and G. Casati, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.93.184301 93, 184301 (2004).
3. B. Hu, L. Yang, and Y. Zhang, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.97.124302 97, 124302 (2006). (Pubitemid 44414328)
4. B. Li, L. Wang, and G. Casati, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2191730 88, 143501 (2006).
5. N. Yang, N. Li, L. Wang, and B. Li, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.76.020301 76, 020301 (R) (2007).
6. H.-B. Li, Q.-M. Nie, and X.-T. Xin, Chin. Phys. Lett. CPLEEU 0256-307X 10.1088/0256-307X/26/7/074401 26, 074401 (2009).
7. M. Alaghemandi, E. Algaer, M. C. Böhm, and F. Müller-Plathe, Nanotechnology NNOTER 0957-4484 10.1088/0957-4484/20/11/115704 20, 115704 (2009);
8. M. Alaghemandi, F. Leroy, F. Müller-Plathe, and M. C. Böhm, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.81.125410 81, 125410 (2010).
9. E. Pereira, Phys. Rev. E PLEEE8 1539-3755 10.1103/PhysRevE.82.040101 82, 040101 (R) (2010).
10. E. Pereira, Phys. Rev. E PLEEE8 1539-3755 10.1103/PhysRevE.83.031106 83, 031106 (2011).
11. C. W. Chang, D. Okawa, A. Majumdar, and A. Zettl, Science SCIEAS 0036-8075 10.1126/science.1132898 314, 1121 (2006); (Pubitemid 44789037)
12. W. Kobayashi, Y. Teraoka, and I. Terasaki, J. Electron. Mater. JECMA5 0361-5235 10.1007/s11664-010-1302-5 39, 1488 (2010)
13. B. Li, G. Casati, J. Wang, and T. Prosen, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.92.254301 92, 254301 (2004).
14. J. L. Lebowitz and H. Spohn, J. Stat. Phys. JSTPBS 0022-4715 10.1007/BF01011774 19, 633 (1978);
15. R. Tehver, F. Toigo, J. Koplik, and J. R. Banavar, Phys. Rev. E 1539-3755 10.1103/PhysRevE.57.R17 57, R17 (1998).
16. J. Bricmont and A. Kupiainen, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.98.214301 98, 214301 (2007); (Pubitemid 47139652)
17. J. Bricmont and A. Kupiainen, Commun. Math. Phys. CMPHAY 0010-3616 10.1007/s00220-007-0284-5 274, 555 (2007).
18. K. Aoki, J. Lukkarinen, and H. Spohn, J. Stat. Phys. JSTPBS 0022-4715 10.1007/s10955-006-9171-2 124, 1105 (2006). (Pubitemid 44581241)
19. K. Aoki and D. Kusnezov, Phys. Lett. A PYLAAG 0375-9601 10.1016/S0375-9601(99)00899-3 265, 250 (2000).
20. N. Li and B. Li, Phys. Rev. E PLEEE8 1539-3755 10.1103/PhysRevE.76.011108 76, 011108 (2007). (Pubitemid 47115678)
21. J. Wang, E. Pereira, and G. Casati (unpublished).
22. H. Zhao, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.96.140602 96, 140602 (2006).