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Volumn , Issue , 2008, Pages
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Characterization and calibration of MEMS inertial measurement units
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Author keywords
[No Author keywords available]
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Indexed keywords
CALIBRATION PARAMETERS;
COST-EFFECTIVE SENSORS;
ERROR MODEL;
ERROR SOURCES;
INERTIAL MEASUREMENT UNIT;
INERTIAL SENSOR;
MEMS INERTIAL SENSORS;
MEMS TECHNOLOGY;
MICRO-STRAIN;
SENSOR PERFORMANCE;
STATE MEASUREMENTS;
STATIC AND DYNAMIC;
CALIBRATION;
MEASUREMENT ERRORS;
SENSORS;
SIGNAL PROCESSING;
UNITS OF MEASUREMENT;
INERTIAL NAVIGATION SYSTEMS;
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EID: 84863740812
PISSN: 22195491
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (11)
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References (9)
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