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Solid State Communications

Volumn 152, Issue 15, 2012, Pages 1311-1316

Issues with characterizing transport properties of graphene field effect transistors

(3) Venugopal, Archana a Colombo, Luigi b Vogel, Eric M a,c

a The University of Texas at Dallas (United States)

b TEXAS INSTRUMENTS (United States)

c Georgia Institute of Technology (United States)

Author keywords

A. Graphene; D. Contact resistance; D. Mobility

Indexed keywords

CHANNEL MOBILITY; DEPOSITED METAL; DEVICE RESISTANCE; PRIMARY PARAMETERS; TEST STRUCTURE; TOTAL RESISTANCE;

CONTACT RESISTANCE; FIELD EFFECT TRANSISTORS; GRAPHENE; SILICA;

TRANSPORT PROPERTIES;

EID: 84863715491 PISSN: 00381098 EISSN: None Source Type: Journal
DOI: 10.1016/j.ssc.2012.04.042 Document Type: Article

Times cited : (22)

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