In-plane dielectric and magnetoelectric studies of BiFeO 3

Physica Status Solidi (A) Applications and Materials Science

Volumn 209, Issue 7, 2012, Pages 1207-1212

  Kumar, Ashok ^a,b   Scott, J F ^a,c   Martinez R ^a   Srinivasan, G ^d   Katiyar, R S ^a  

^a UNIVERSITY OF PUERTO RICO   (Puerto Rico)

^b NATIONAL PHYSICAL LABORATORY   (India)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^d OAKLAND UNIVERSITY   (United States)

Author keywords

bismuth ferrite; in plane functional properties; interdigital electrodes; multiferroics; thin films

Indexed keywords

AS-GROWN THIN FILMS; BISMUTH FERRITES; DIELECTRIC BEHAVIOR; EXPERIMENTAL CYCLES; EXPERIMENTAL DATA; FUNCTIONAL PROPERTIES; INTERDIGITAL ELECTRODE; LOW TEMPERATURES; MULTIFERROICS; RELAXOR FERROELECTRIC; SKIN LAYER; SPIN REORIENTATION TRANSITIONS; SURFACE PHASE TRANSITIONS; TEMPERATURE DEPENDENCE; TEMPERATURE DEPENDENT; THEORETICAL MODELS; VOGEL-FULCHER;

BISMUTH; DIELECTRIC DEVICES; ELECTRODES; THIN FILMS;

DIELECTRIC LOSSES;

EID: 84863705418     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.201228154     Document Type: Article

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