Spectroscopic ellipsometry of superparamagnetic nanoparticles in thin films of poly(N-isopropylacrylamide)

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 30, Issue 4, 2012, Pages

  Rauch, Sebastian ^a   Eichhorn, Klaus Jochen ^a   Stamm, Manfred ^a   Uhlmann, Petra ^a  

^a LEIBNIZ INSTITUTE OF POLYMER RESEARCH DRESDEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONCENTRATION RANGES; LINEAR BEHAVIOR; N-ISOPROPYLACRYLAMIDES; PURE POLYMERS; SPECTRAL RANGE; SUPERPARAMAGNETIC NANOPARTICLES; THIN-FILM PROPERTIES;

ACRYLIC MONOMERS; ATOMIC FORCE MICROSCOPY; NANOPARTICLES; OPTICAL CONSTANTS; OPTICAL PROPERTIES; POLYMER FILMS; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPIC ELLIPSOMETRY; SUPERPARAMAGNETISM;

THIN FILMS;

EID: 84863681299     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.4727737     Document Type: Article

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