Growth and characterization of La 1 - XA xMnO 3 (A = Ag and K, x = 0.33) epitaxial and polycrystalline manganite thin films derived by sol-gel dip-coating technique

Thin Solid Films

Volumn 520, Issue 19, 2012, Pages 6138-6144

  Goktas, A ^a,b   Mutlu, I H ^a   Kawashi, A ^b  

^a HARRAN UNIVERSITY   (Turkey)

^b SHIMANE UNIVERSITY   (Japan)

Author keywords

Epitaxial films; Grain size; Magnetic films; Magnetoresistance; Polycrystalline films; Sol gel; Strain

Indexed keywords

ANNEALING TEMPERATURES; CONDUCTION ELECTRONS; GRAIN SIZE; GRAIN SIZE EFFECT; IONIC RADIUS; LOW TEMPERATURES; MAGNETORESISTANCE PROPERTIES; MANGANITE THIN FILMS; ORIENTED FILMS; PARAMAGNETIC-FERROMAGNETIC PHASE TRANSITIONS; POLYCRYSTALLINE; POLYCRYSTALLINE FILM; QUARTZ SUBSTRATE; RHOMBOHEDRAL STRUCTURES; SOL GEL DIP COATING; SPIN DEPENDENT SCATTERING; TEMPERATURE-DEPENDENT RESISTIVITY;

COATINGS; ELECTRIC PROPERTIES; ELECTRIC RESISTANCE; EPITAXIAL FILMS; EPITAXIAL GROWTH; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; LANTHANUM ALLOYS; MAGNETIC FILMS; MAGNETORESISTANCE; MANGANESE OXIDE; PARAMAGNETISM; PEROVSKITE; QUARTZ; SEMICONDUCTOR INSULATOR BOUNDARIES; SOL-GELS; STRAIN; SUBSTRATES; TRANSPORT PROPERTIES; X RAY DIFFRACTION;

SILVER;

EID: 84863561946     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2012.06.006     Document Type: Article

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