Fabrication and optical characterization of light trapping silicon nanopore and nanoscrew devices

Nanotechnology

Volumn 23, Issue 12, 2012, Pages

  Jin, Hyunjong ^a   Liu, G Logan ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSE REFLECTION; INDEX OF REFRACTION; LIGHT-TRAPPING; NANO SCALE; NANOTEXTURED; OPTICAL CHARACTERIZATION; OPTICAL REFLECTION; PHOTON TRAPPING; POTENTIAL APPLICATIONS; SI SUBSTRATES; SILICON STRUCTURES; SPATIAL FEATURES; SPECULAR REFLECTIONS; SURFACE OPTICAL; VISIBLE WAVELENGTHS; WAVELENGTH RANGES;

NANOPORES; NANOSTRUCTURES; PHOTONS; REFRACTIVE INDEX; SILICON; SUBSTRATES;

SEMICONDUCTING SILICON;

EID: 84863387283     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/23/12/125202     Document Type: Article

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