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Volumn 170, Issue 6, 2012, Pages 28-32
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3-D materials characterization over a
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Author keywords
[No Author keywords available]
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Indexed keywords
ABERRATION-CORRECTED;
DUAL-BEAM;
ELEMENTAL DISTRIBUTION;
HEAVY WORKLOADS;
IMAGING CAPABILITIES;
INDUSTRIAL USERS;
INTERNATIONAL PARTNERS;
MATERIALS CHARACTERIZATION;
OXYGEN IMPURITY;
SMALL HOLE;
TEM SAMPLE PREPARATION;
TI ATOMS;
UNIVERSITY OF MANCHESTER;
ELECTRON MICROSCOPY;
GRAPHENE;
THREE DIMENSIONAL;
CHARACTERIZATION;
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EID: 84863333146
PISSN: 08827958
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Article |
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Times cited : (3)
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References (0)
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