The influence of core geometry on the crystallography of silicon optical fiber

Journal of Crystal Growth

Volumn 352, Issue 1, 2012, Pages 53-58

  Morris, Stephanie ^a   McMillen, Colin ^a   Hawkins, Thomas ^a   Foy, Paul ^a   Stolen, Roger ^a   Ballato, John ^a   Rice, Robert ^b  

^a Clemson University   (United States)

^b Dreamcatchers Consulting   (United States)

Author keywords

A1: X ray diffraction; A2: Growth from melt; B2: Semiconducting silicon; B3: Optical fiber devices

Indexed keywords

A2: GROWTH FROM MELTS; CROSSSECTIONAL GEOMETRY; CRYSTAL FORMATION; CRYSTALLINE SEMICONDUCTORS; CRYSTALLINITIES; CRYSTALLOGRAPHIC AXIS; FIBER AXIS; FIBER LENGTH; GLASS OPTICAL FIBERS; IN-FIBER; MICROSTRUCTURAL FEATURES; OPTICAL FIBER DEVICES; POLYCRYSTALLINE; ROTATION AND TILTING; SILICA TUBES; SILICON CORES; SINGLE CRYSTALLINE SEMICONDUCTORS; SINGLE-CRYSTALLINE; WORK STUDY;

CRYSTALLINE MATERIALS; CRYSTALLOGRAPHY; FIBERS; GEOMETRY; MICROSTRUCTURAL EVOLUTION; MINERALOGY; OPTICAL FIBERS; SILICA; X RAY DIFFRACTION;

OPTICAL FIBER FABRICATION;

EID: 84863331078     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2011.12.009     Document Type: Conference Paper

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