Anti-reflection coating for nitrogen-vacancy optical measurements in diamond

Applied Physics Letters

Volumn 100, Issue 25, 2012, Pages

  Yeung, T K ^a,b   Le Sage, D ^b,c   Pham, L M ^a   Stanwix, P L ^b,c   Walsworth, R L ^b,c  

^a HARVARD UNIVERSITY   (United States)

^b HARVARD UNIVERSITY   (United States)

^c HARVARD SMITHSONIAN CENTER FOR ASTROPHYSICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANTI-REFLECTION; AR COATINGS; DIAMOND SURFACES; EFFICIENT DETECTION; EXCITATION LASERS; FLUORESCENCE MEASUREMENTS; INTERFERENCE PATTERNS; MAGNETIC FIELD SENSING; NV CENTER; OPTICAL MEASUREMENT; OPTICAL REFLECTION; QUARTER-WAVELENGTH; SILICA LAYERS; SPATIAL VARIATIONS; SPATIALLY RESOLVED;

COATINGS; COLOR CENTERS; FLUORESCENCE; LASER EXCITATION; MAGNETIC FIELDS; OPTICAL DATA PROCESSING; OPTICAL VARIABLES MEASUREMENT; SILICA;

DIAMONDS;

EID: 84863328908     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4730401     Document Type: Article

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