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Volumn 100, Issue 26, 2012, Pages

Modeling the underlying mechanisms for organic memory devices: Tunneling, electron emission, and oxygen adsorbing

Author keywords

[No Author keywords available]

Indexed keywords

BISTABLES; DEVICE STRUCTURES; I - V CURVE; METALLIC ISLANDS; NEGATIVE DIFFERENTIAL RESISTANCE EFFECT; ORGANIC MEMORY DEVICES; SCATTERING OPERATORS; THEORETICAL MODELS; THEORETICAL STUDY; TUNNELING CURRENT; UNDERLYING MECHANISM;

EID: 84863321241     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4731879     Document Type: Article
Times cited : (5)

References (19)
  • 6
    • 34547346804 scopus 로고    scopus 로고
    • 10.1002/adma.200602564
    • J. C. Scott and L. D. Bozano, Adv. Mater. 19, 1452 (2007). 10.1002/adma.200602564
    • (2007) Adv. Mater. , vol.19 , pp. 1452
    • Scott, J.C.1    Bozano, L.D.2
  • 7
  • 8
    • 0037150064 scopus 로고    scopus 로고
    • 10.1088/0022-3727/35/8/312
    • R. E. Thurstans and D. P. Oxley, J. Phys. D 35, 802 (2002). 10.1088/0022-3727/35/8/312
    • (2002) J. Phys. D , vol.35 , pp. 802
    • Thurstans, R.E.1    Oxley, D.P.2
  • 19
    • 84863329004 scopus 로고    scopus 로고
    • See supplementary material at E-APPLAB-100-089227 for the detailed description of the methodology
    • See supplementary material at http://dx.doi.org/10.1063/1.4731879 E-APPLAB-100-089227 for the detailed description of the methodology.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.