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Volumn 15, Issue 6, 2012, Pages

Inverse free electron laser accelerator for advanced light sources

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EID: 84863319032     PISSN: None     EISSN: 10984402     Source Type: Journal    
DOI: 10.1103/PhysRevSTAB.15.061301     Document Type: Article
Times cited : (32)

References (29)
  • 3
    • 4143098711 scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.71.4146
    • A. Mikhailichenko and M. Zolotorev, Phys. Rev. Lett. 71, 4146 (1993). PRLTAO 0031-9007 10.1103/PhysRevLett.71.4146
    • (1993) Phys. Rev. Lett. , vol.71 , pp. 4146
    • Mikhailichenko, A.1    Zolotorev, M.2
  • 4
    • 55849108119 scopus 로고    scopus 로고
    • PRABFM 1098-4402 10.1103/PhysRevSTAB.11.101301
    • C.M.S. Sears, Phys. Rev. ST Accel. Beams 11, 101301 (2008). PRABFM 1098-4402 10.1103/PhysRevSTAB.11.101301
    • (2008) Phys. Rev. ST Accel. Beams , vol.11 , pp. 101301
    • Sears, C.M.S.1
  • 6
    • 18244384965 scopus 로고    scopus 로고
    • Method of an enhanced self-amplified spontaneous emission for x-ray free electron lasers
    • DOI 10.1103/PhysRevSTAB.8.040701, 040701
    • A. Zholents, Phys. Rev. ST Accel. Beams 8, 040701 (2005). PRABFM 1098-4402 10.1103/PhysRevSTAB.8.040701 (Pubitemid 40630481)
    • (2005) Physical Review Special Topics - Accelerators and Beams , vol.8 , Issue.4 , pp. 8-13
    • Zholents, A.A.1
  • 7
    • 36849102990 scopus 로고
    • JAPIAU 0021-8979 10.1063/1.1661650
    • R. Palmer, J. Appl. Phys. 43, 3014 (1972). JAPIAU 0021-8979 10.1063/1.1661650
    • (1972) J. Appl. Phys. , vol.43 , pp. 3014
    • Palmer, R.1
  • 9
    • 12144288235 scopus 로고    scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.92.054801
    • W. Kimura, Phys. Rev. Lett. 92, 054801 (2004). PRLTAO 0031-9007 10.1103/PhysRevLett.92.054801
    • (2004) Phys. Rev. Lett. , vol.92 , pp. 054801
    • Kimura, W.1
  • 16
    • 6144257569 scopus 로고
    • JAPIAU 0021-8979 10.1063/1.333388
    • W. Zakowicz, J. Appl. Phys. 55, 3421 (1984). JAPIAU 0021-8979 10.1063/1.333388
    • (1984) J. Appl. Phys. , vol.55 , pp. 3421
    • Zakowicz, W.1
  • 18
    • 84863326739 scopus 로고    scopus 로고
    • Amplitude Technologies, 2-4 rue du Bois Chaland, CE 2926, 91029 EVRY, France
    • Amplitude Technologies, 2-4 rue du Bois Chaland, CE 2926, 91029 EVRY, France [http://www.amplitude-technologies.com/].
  • 19
    • 0000005018 scopus 로고
    • NUIMAL 0029-554X 10.1016/0029-554X(81)90477-8
    • K. Halbach, Nucl. Instrum. Methods 187, 109 (1981). NUIMAL 0029-554X 10.1016/0029-554X(81)90477-8
    • (1981) Nucl. Instrum. Methods , vol.187 , pp. 109
    • Halbach, K.1
  • 27
    • 20444409466 scopus 로고    scopus 로고
    • Measurement of Fourier-synthesized optical waveforms
    • DOI 10.1364/OL.30.001222
    • S.N. Goda, M.Y. Shverdin, D.R. Walker, and S.E. Harris, Opt. Lett. 30, 1222 (2005). OPLEDP 0146-9592 10.1364/OL.30.001222 (Pubitemid 40795111)
    • (2005) Optics Letters , vol.30 , Issue.10 , pp. 1222-1224
    • Goda, S.N.1    Shverdin, M.Y.2    Walker, D.R.3    Harris, S.E.4
  • 28
    • 77957596951 scopus 로고    scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.105.154801
    • D.F. Ratner and A.W. Chao, Phys. Rev. Lett. 105, 154801 (2010). PRLTAO 0031-9007 10.1103/PhysRevLett.105.154801
    • (2010) Phys. Rev. Lett. , vol.105 , pp. 154801
    • Ratner, D.F.1    Chao, A.W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.