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Applied Physics Letters

Volumn 100, Issue 25, 2012, Pages

Nondestructive two-dimensional phase imaging of embedded defects via on-chip spintronic sensor

(8) Cao, Z X a,b Harder, M b Fu, L b Zhang, B a Lu, W a Bridges, G E b Gui, Y S b Hu, C M b

a INSTITUTE OF GEOLOGY AND GEOPHYSICS (China)

b UNIVERSITY OF MANITOBA (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DC VOLTAGE; ELECTRIC AND MAGNETIC FIELDS; EMBEDDED DEFECTS; MICROWAVE FIELD; NEAR FIELDS; NON DESTRUCTIVE; ON CHIPS; PHASE IMAGING; PHASE IMAGING TECHNIQUES; RELATIVE PHASE; SPINTRONIC SENSORS; SUB-WAVELENGTH;

DEFECTS; IMAGING TECHNIQUES; MAGNETIC FIELDS; MAGNETOELECTRONICS;

MICROWAVE SENSORS;

EID: 84863304485 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4729785 Document Type: Article

Times cited : (14)

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