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Volumn , Issue , 2011, Pages
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Extended scalability of perpendicular STT-MRAM towards sub-20nm MTJ node
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Author keywords
[No Author keywords available]
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Indexed keywords
CONVENTIONAL MEMORIES;
DOWN-SCALING;
FEATURE SIZES;
INTEGRATION PROCESS;
INTERFACE ANISOTROPY;
SPIN TRANSFER TORQUE;
ELECTRON DEVICES;
INTERFACES (MATERIALS);
MRAM DEVICES;
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EID: 84863026711
PISSN: 01631918
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/IEDM.2011.6131602 Document Type: Conference Paper |
Times cited : (58)
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References (7)
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