Sub-diffraction thin-film sensing with planar terahertz metamaterials

Optics Express

Volumn 20, Issue 3, 2012, Pages 3345-3352

  Withayachumnankul, Withawat ^a,b   Lin, Hungyen ^a   Serita, Kazunori ^c   Shah, Charan M ^d   Sriram, Sharath ^d   Bhaskaran, Madhu ^d   Tonouchi, Masayoshi ^c   Fumeaux, Christophe ^a   Abbott, Derek ^a  

^a UNIVERSITY OF ADELAIDE   (Australia)

^b KING MONGKUT'S INSTITUTE OF TECHNOLOGY LADKRABANG   (Thailand)

^c OSAKA UNIVERSITY   (Japan)

^d RMIT UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC FILMS; DIFFRACTION; ELECTRIC EXCITATION; METAMATERIALS; Q FACTOR MEASUREMENT; RESONATORS; THIN FILMS;

BIOMOLECULAR DETECTIONS; DIFFRACTION LIMITED; FAR FIELD MEASUREMENT; SENSING PLATFORMS; SUB-WAVELENGTH RESONATORS; TERAHERTZ FREQUENCY RANGE; TERAHERTZ SOURCES; THIN DIELECTRIC FILM;

DIELECTRIC MATERIALS;

ARTICLE; ARTIFICIAL MEMBRANE; EQUIPMENT; EQUIPMENT DESIGN; OPTICAL INSTRUMENTATION; TERAHERTZ RADIATION; TRANSDUCER;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MEMBRANES, ARTIFICIAL; OPTICAL DEVICES; TERAHERTZ RADIATION; TRANSDUCERS;

EID: 84863011190     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.003345     Document Type: Article

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