Series DC arc characteristic study and the application in fault recognition

Gaoya Dianqi/High Voltage Apparatus

Volumn 48, Issue 5, 2012, Pages 6-10

  Yao, Xiu ^a   Ji, Sheng Chang ^b   Herrera, Luis ^a   Wang, Jin ^a  

^a OHIO STATE UNIVERSITY   (United States)

^b XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

Current variation; DC arc characteristics; Fault detection

Indexed keywords

EID: 84862981865     PISSN: 10011609     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (9)

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