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Volumn 46, Issue 2, 2012, Pages 970-976

Electron energy-loss safe-dose limits for manganese valence measurements in environmentally relevant manganese oxides

Author keywords

[No Author keywords available]

Indexed keywords

BEAM DAMAGE; BIRNESSITE; FLUENCES; MN OXIDES; OXIDATION PROCESS; OXIDIZING POTENTIALS; PHARMACEUTICAL PRODUCTS; REDOX-ACTIVE SUBSTANCES; TODOROKITES; TRANSMISSION ELECTRON MICROSCOPE; VALENCE STATE;

EID: 84862930857     PISSN: 0013936X     EISSN: 15205851     Source Type: Journal    
DOI: 10.1021/es203516h     Document Type: Article
Times cited : (19)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.