Atomic force microscopy: A tool for studying biophysical surface properties underpinning fungal interactions with plants and substrates

Methods in Molecular Biology

Volumn 835, Issue , 2012, Pages 151-164

  Adams, Elizabeth ^a   Emerson, Danielle ^a   Croker, Sean ^b   Kim, Hye Seon ^c   Modla, Shannon ^a   Kang, Seogchan ^c   Czymmek, Kirk ^a  

^a UNIVERSITY OF DELAWARE   (United States)

^b WEST CHESTER UNIVERSITY   (United States)

^c PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

AFM; Arabidopsis thaliana; Biofunctionalization; Fluorescent proteins; Fungi; Fusarium oxysporum; Plant pathogen interactions; Silane; Unbinding forces

Indexed keywords

ARTICLE; ATOMIC FORCE MICROSCOPY; FUNGUS; FUNGUS SPORE; HOST PATHOGEN INTERACTION; METHODOLOGY; MICROBIOLOGY; PHYSIOLOGY; PLANT; SURFACE PROPERTY;

FUNGI; HOST-PATHOGEN INTERACTIONS; MICROSCOPY, ATOMIC FORCE; PLANTS; SPORES, FUNGAL; SURFACE PROPERTIES;

ARABIDOPSIS; ARABIDOPSIS THALIANA; BACTERIA (MICROORGANISMS); FUNGI; FUSARIUM OXYSPORUM;

EID: 84862929712     PISSN: 10643745     EISSN: None     Source Type: Book Series    
DOI: 10.1007/978-1-61779-501-5_10     Document Type: Article

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