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Volumn 12, Issue SUPPL. 1, 2012, Pages

Can the incident photo-to-electron conversion efficiency be used to calculate short-circuit current density of dye-sensitized solar cells

Author keywords

Dye sensitized solar cell; Incident light intensity; Incident photo to electron conversion efficiency; Nonlinearity; Short circuit current density

Indexed keywords

BIAS LIGHT INTENSITY; DYE-SENSITIZED SOLAR CELL; DYE-SENSITIZED SOLAR CELLS; E-LIGHT; INCIDENT LIGHT INTENSITY; LIGHT INTENSITY; MEASURED RESULTS; NON-LINEARITY; PHOTON FLUX; SHORT-CIRCUIT PHOTOCURRENT; SIMPLE METHOD; WORKING CONDITIONS;

EID: 84862892223     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2011.03.060     Document Type: Conference Paper
Times cited : (50)

References (31)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.