Improvements to facial contour detection by hierarchical fitting and regression

1st Asian Conference on Pattern Recognition, ACPR 2011

Volumn , Issue , 2011, Pages 273-277

  Irie, Atsushi ^a   Takagiwa, Mutsuki ^b   Moriyama, Kozo ^a   Yamashita, Takayoshi ^a  

^a OMRON CORPORATION   (Japan)

^b Tome R and D Inc   (Japan)

Author keywords

facial contour detection; global fitting; local fitting; regression

Indexed keywords

CONTOUR DETECTION; CONTOUR POINTS; FACIAL EXPRESSIONS; FACIAL IMAGES; FACIAL MODEL; FACIAL PARTS; FACIAL SHAPE; FALSE POSITIVE RATES; GLOBAL FITTING; GLOBAL MODELS; HIERARCHICAL MODEL; HUMAN FACIAL EXPRESSIONS; LOCAL FITTING; LOCAL MODEL; REGRESSION; TEXTURE MODELS;

HIERARCHICAL SYSTEMS; IMAGE TEXTURE;

PATTERN RECOGNITION;

EID: 84862886222     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ACPR.2011.6166689     Document Type: Conference Paper

References (4)

1. T.F. Cootes, C.J. Taylor, D.H. Cooper, and J. Graham, "Active Shape Models - Their Training and Application," CVIU, 1995.
2. T.F. Cootes, G.J. Edwards, and C.J. Taylor, "Active appearance models," In Burkhardt and Neumann, editors, Computer Vision - ECCV' 98, 1998.
3. K. Kinoshita, Y. Konishi, S. Lao, M. Kawade, H. Murase , "Perturbation feature and it's application to shape model fitting for facial images," IEICE Trans. D, vol.J94-D no.4, pp.721-729, April 2011.
4. P. Viola, M. Jones, "Rapid Object Detection using a Boosted Cascade of Simple Features," CVPR, 2001.