메뉴 건너뛰기




Volumn 33, Issue 7, 2012, Pages 925-927

Graphene-based interconnects on hexagonal boron nitride substrate

Author keywords

Breakdown power density; conduction; electrical annealing; graphene; hexagonal boron nitride (h BN); interconnects

Indexed keywords

ALTERNATIVE SUBSTRATES; DIRAC POINT; ELECTRICAL ANNEALING; HEXAGONAL BORON NITRIDE; HEXAGONAL BORON NITRIDE (H-BN); MATERIAL SYSTEMS; PERFORMANCE LIMITS; PERFORMANCE METRICS; POSITIVE SHIFT; POWER DENSITIES;

EID: 84862854865     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2012.2196669     Document Type: Article
Times cited : (36)

References (11)
  • 2
    • 42349113188 scopus 로고    scopus 로고
    • Extremely high thermal conductivity of graphene: Prospects for thermal management applications in nanoelectronic circuits
    • Apr.
    • S. Ghosh, I. Calizo, D. Teweldebrhan, E. P. Pokatilov, D. L. Nika, A. A. Balandin,W. Bao, F. Miao, and C. N. Lau, "Extremely high thermal conductivity of graphene: Prospects for thermal management applications in nanoelectronic circuits," Appl. Phys. Lett., vol. 92, no. 15, p. 151 911, Apr. 2008.
    • (2008) Appl. Phys. Lett. , vol.92 , Issue.15 , pp. 151911
    • Ghosh, S.1    Calizo, I.2    Teweldebrhan, D.3    Pokatilov, E.P.4    Nika, D.L.5    Balandinw. Bao, A.A.6    Miao, F.7    Lau, C.N.8
  • 3
    • 78650669623 scopus 로고    scopus 로고
    • Electromechanical robustness of monolayer graphene with extreme bending
    • Nov.
    • B. Briggs, B. Nagabhirava, G. Rao, R. Geer, H. Gao, Y. Xu, and B. Yu, "Electromechanical robustness of monolayer graphene with extreme bending," Appl. Phys. Lett., vol. 97, no. 22, p. 223 102, Nov. 2010.
    • (2010) Appl. Phys. Lett. , vol.97 , Issue.22 , pp. 223102
    • Briggs, B.1    Nagabhirava, B.2    Rao, G.3    Geer, R.4    Gao, H.5    Xu, Y.6    Yu, B.7
  • 4
    • 67649221401 scopus 로고    scopus 로고
    • Breakdown current density of graphene nanoribbons
    • Jun.
    • R. Murali, Y. Yang, K. Brenner, T. Beck, and J. D. Meindl, "Breakdown current density of graphene nanoribbons," Appl. Phys. Lett., vol. 94, no. 24, p. 2 437 114, Jun. 2009.
    • (2009) Appl. Phys. Lett. , vol.94 , Issue.24 , pp. 2437114
    • Murali, R.1    Yang, Y.2    Brenner, K.3    Beck, T.4    Meindl, J.D.5
  • 5
    • 77957584400 scopus 로고    scopus 로고
    • Bilayer graphene system: Current-induced reliability limit
    • Oct.
    • T. Yu, E. Lee, B. Briggs, B. Nagabhirava, and B. Yu, "Bilayer graphene system: Current-induced reliability limit," IEEE Electron Device Lett., vol. 31, no. 10, pp. 1155-1157, Oct. 2010.
    • (2010) IEEE Electron Device Lett. , vol.31 , Issue.10 , pp. 1155-1157
    • Yu, T.1    Lee, E.2    Briggs, B.3    Nagabhirava, B.4    Yu, B.5
  • 6
    • 41849125958 scopus 로고    scopus 로고
    • 2
    • DOI 10.1038/nnano.2008.58, PII NNANO200858
    • J. H. Chen, C. Jang, S. D. Xiao, M. Ishigami, and M. S. Fuhrer, "Intrinsic and extrinsic performance limits of graphene devices on SiO2," Nature Nanotechnol., vol. 3, pp. 206-209, Apr. 2008. (Pubitemid 351499398)
    • (2008) Nature Nanotechnology , vol.3 , Issue.4 , pp. 206-209
    • Chen, J.-H.1    Jang, C.2    Xiao, S.3    Ishigami, M.4    Fuhrer, M.S.5
  • 7
    • 79960083418 scopus 로고    scopus 로고
    • Chemical vapor depositionassembled graphene field-effect transistor on hexagonal boron nitride
    • Jun.
    • E. Kim, T. Yu, E. S. Song, and B. Yu, "Chemical vapor depositionassembled graphene field-effect transistor on hexagonal boron nitride," Appl. Phys. Lett., vol. 98, p. 262103, Jun. 2011.
    • (2011) Appl. Phys. Lett. , vol.98 , pp. 262103
    • Kim, E.1    Yu, T.2    Song, E.S.3    Yu, B.4
  • 9
    • 79960658023 scopus 로고    scopus 로고
    • Thermally limited current carrying ability of graphene nanoribbons
    • Jun.
    • A. D. Liao, J. Z. Wu, X. Wang, K. Tahy, D. Jena, H. Dai, and E. Pop, "Thermally limited current carrying ability of graphene nanoribbons," Phys. Rev. Lett., vol. 106, no. 25, p. 256 801, Jun. 2011.
    • (2011) Phys. Rev. Lett. , vol.106 , Issue.25 , pp. 256801
    • Liao, A.D.1    Wu, J.Z.2    Wang, X.3    Tahy, K.4    Jena, D.5    Dai, H.6    Pop, E.7
  • 10
    • 79960912809 scopus 로고    scopus 로고
    • Formation of graphene p-n junction via complementary doping
    • Aug.
    • T. Yu, C. Kim, C. W. Liang, and B. Yu, "Formation of graphene p-n junction via complementary doping," IEEE Electron Device Lett., vol. 32, no. 8, pp. 1050-1052, Aug. 2011.
    • (2011) IEEE Electron Device Lett. , vol.32 , Issue.8 , pp. 1050-1052
    • Yu, T.1    Kim, C.2    Liang, C.W.3    Yu, B.4
  • 11
    • 79960618174 scopus 로고    scopus 로고
    • Local electrical stress-induced doping and formation of monolayer graphene p-n junction
    • Jun.
    • T. Yu, C. W. Liang, C. Kim, and B. Yu, "Local electrical stress-induced doping and formation of monolayer graphene p-n junction," Appl. Phys. Lett., vol. 98, no. 24, p. 243 105, Jun. 2011.
    • (2011) Appl. Phys. Lett. , vol.98 , Issue.24 , pp. 243105
    • Yu, T.1    Liang, C.W.2    Kim, C.3    Yu, B.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.