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Volumn 526, Issue , 2012, Pages 91-97
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Dielectric relaxation behavior of A xCo 1-xFe 2O 4 (A = Zn, Mg) mixed ferrites
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Author keywords
Chemical synthesis; Dielectric response; Scanning electron microscopy; X ray diffraction
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Indexed keywords
AC CONDUCTIVITY;
CHEMICAL COPRECIPITATION METHOD;
CHEMICAL SYNTHESIS;
CUBIC STRUCTURE;
DIELECTRIC RELAXATION BEHAVIOR;
DIELECTRIC RESPONSE;
ELECTRICAL MODULUS;
FUNCTION OF FREQUENCY;
INTERFACIAL POLARIZATION;
LOSS TANGENT;
MG-DOPED;
MICROWAVE APPLICATIONS;
MINIMUM VALUE;
MIXED FERRITES;
RIETVELD;
ROOM TEMPERATURE;
SCANNING ELECTRON MICROSCOPIES (SEM);
SPACE GROUPS;
TEMPERATURE DEPENDENT;
ACTIVATION ENERGY;
FERRITE;
FERRITES;
SCANNING ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
ZINC;
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EID: 84862822262
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2012.02.089 Document Type: Article |
Times cited : (146)
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References (36)
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