Study on the application of reduced graphene oxide and multiwall carbon nanotubes hybrid materials for simultaneous determination of catechol, hydroquinone, p-cresol and nitrite

Analytica Chimica Acta

Volumn 724, Issue , 2012, Pages 40-46

  Hu, Fangxin ^a   Chen, Shihong ^a   Wang, Chengyan ^a   Yuan, Ruo ^a   Yuan, Dehua ^a   Wang, Cun ^a  

^a SOUTHWEST UNIVERSITY   (China)

Author keywords

Environmental contamination; Hybrid materials; Multiwall carbon nanotubes; Reduced graphene oxide; Simultaneous detection

Indexed keywords

ATOMIC FORCE MICROSCOPIES (AFM); DETECTION LIMITS; ELECTRICAL CONDUCTIVITY; ENHANCED STABILITY; ENVIRONMENTAL CONTAMINATION; FABRICATED SENSORS; FILM-FORMING; HIGH SURFACE AREA; LINEAR RESPONSE RANGE; MODIFIED ELECTRODES; P-CRESOL; REDUCED GRAPHENE OXIDES; RIVER WATER SAMPLES; SCANNING ELECTRON MICROSCOPIES (SEM); SIMULTANEOUS DETECTION; SIMULTANEOUS DETERMINATIONS; SIMULTANEOUS MEASUREMENT; SORPTION-DESORPTION ISOTHERM; X RAY PHOTOELECTRON SPECTROSCOPIES (XPS);

ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; ELECTRIC CONDUCTIVITY; HYBRID MATERIALS; KETONES; MULTIWALLED CARBON NANOTUBES (MWCN); NITROGEN OXIDES; SCANNING ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

PHENOLS;

CATECHOL; GRAPHENE; HYDROQUINONE; MULTI WALLED NANOTUBE; NITRITE; PARA CRESOL; RIVER WATER;

ARTICLE; ATOMIC FORCE MICROSCOPY; CONCENTRATION (PARAMETERS); CONTROLLED STUDY; ELECTRIC CONDUCTIVITY; ELECTRODE; LIMIT OF DETECTION; MATERIALS TESTING; MOLECULAR STABILITY; NANOCHEMISTRY; PHASE SEPARATION; POROSITY; PRIORITY JOURNAL; PROCESS OPTIMIZATION; REDUCTION KINETICS; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; WATER ANALYSIS; WATER CONTAMINATION; WATER POLLUTANT; WATER SAMPLING; X RAY PHOTOELECTRON SPECTROSCOPY;

CATECHOLS; CRESOLS; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; ELECTRODES; GRAPHITE; HYDROQUINONES; LIMIT OF DETECTION; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, SCANNING; NANOTUBES, CARBON; NITRITES; OXIDES; PHOTOELECTRON SPECTROSCOPY; WATER POLLUTANTS, CHEMICAL;

EID: 84862800390     PISSN: 00032670     EISSN: 18734324     Source Type: Journal    
DOI: 10.1016/j.aca.2012.02.037     Document Type: Article

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