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Applied Physics B: Lasers and Optics

Volumn 106, Issue 4, 2012, Pages 927-932

Measuring the topological charge of vortex beams by using an annular ellipse aperture

(4) Tao, H a Liu, Y a Chen, Z a Pu, J a

a HUAQIAO UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

DARK SPOTS; DIFFRACTION PHENOMENON; FAR-FIELD DIFFRACTION; FRAUNHOFER DIFFRACTION; FRAUNHOFER DIFFRACTION PATTERNS; LONG AXIS; OPTICAL VORTEX BEAM; OPTICAL VORTICES; TOPOLOGICAL CHARGES; VORTEX BEAMS;

DIFFRACTION; GEOMETRY; TOPOLOGY;

VORTEX FLOW;

EID: 84862783313 PISSN: 09462171 EISSN: None Source Type: Journal
DOI: 10.1007/s00340-012-4911-2 Document Type: Article

Times cited : (30)

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