Optical nonlinearities of nanostructured VO 2 thin films with low phase transition temperature

Applied Surface Science

Volumn 258, Issue 14, 2012, Pages 5319-5322

  Wang, Boqing ^a   Chen, Sihai ^a   Huang, Zhangli ^a   Fu, Ming ^a  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Low phase transition temperature; Nonlinearity; Ultrafast

Indexed keywords

CRYSTALLITE SIZE; ION BEAMS; NONLINEAR OPTICS; REFRACTIVE INDEX; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; SPUTTERING; TEMPERATURE; TWO PHOTON PROCESSES; VANADIUM DIOXIDE;

LOW PHASE TRANSITION TEMPERATURES; NONLINEAR INDEX OF REFRACTION; NONLINEARITY; REACTIVE ION BEAM SPUTTERING; REFRACTIVE NON-LINEARITY; SEMICONDUCTOR-TO-METAL PHASE TRANSITION; THIRD-ORDER OPTICAL NONLINEARITIES; ULTRA-FAST;

THIN FILMS;

EID: 84862783102     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2012.01.136     Document Type: Article

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