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Volumn 675, Issue , 2012, Pages 40-46

Xenon purity analysis for EXO-200 via mass spectrometry

(76)  Dobi, A a   Hall, C a   Slutsky, S a   Yen, Y R a   Aharmin, B b   Auger, M c   Barbeau, P S d   Benitez Medina, C e   Breidenbach, M f   Cleveland, B b   Conley, R f   Cook, J g   Cook, S e   Counts, I d   Craddock, W f   Daniels, T g   Davis, C G a   Davis, J d   Devoe, R d   Dixit, M h   more..


Author keywords

Double beta decay; Mass spectrometry; Purity; Xenon

Indexed keywords

COLD TRAPS; DOUBLE BETA DECAY; ORDERS OF MAGNITUDE; PURITY; PURITY ANALYSIS; PURITY MEASUREMENT; SPECTROMETRY TECHNIQUE;

EID: 84862777739     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2012.01.066     Document Type: Article
Times cited : (21)

References (13)
  • 6
    • 84862802934 scopus 로고    scopus 로고
    • A. Dobi, et al. arxiv.org/abs/1103.2714.
    • Dobi, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.