Orbital characters determined from Fermi surface intensity patterns using angle-resolved photoemission spectroscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 85, Issue 21, 2012, Pages

  Wang, X P ^a   Richard, P ^a   Huang, Y B ^a   Miao, H ^a   Cevey, L ^a,b   Xu, N ^a   Sun, Y J ^a   Qian, T ^a   Xu, Y M ^c   Shi, M ^d   Hu, J P ^a,e   Dai, X ^a   Ding, H ^a  

^a INSTITUTE OF PHYSICS   (China)

^b EPFL   (Switzerland)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^d PAUL SCHERRER INSTITUTE   (Switzerland)

^e PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84862680212     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.85.214518     Document Type: Article

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