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Optical Materials

Volumn 34, Issue 10, 2012, Pages 1670-1676

Alkynyl-ruthenium based azo-organometallics: Thermal evolution of thin films microstructure

(5) Niziol, Jacek a Fillaut, Jean Luc b Sniechowski, MacIek a Khammar, Farida c Sahraoui, Bouchta d

a AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY (Poland)

b INSTITUT DES SCIENCES CHIMIQUES DE RENNES (France)

c UNIVERSITY OF SOUK AHRAS (Algeria)

d UNIVERSITÉ D'ANGERS (France)

Author keywords

Alkynyl ruthenium compounds; Spectroscopic ellipsometry; X ray diffraction

Indexed keywords

AMORPHOUS FILMS; CRYSTALLINE MATERIALS; MICROSTRUCTURE; OPTICAL PROPERTIES; ORGANOMETALLICS; POWDERS; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

ALKYNYLS; CHEMICAL COMPOSITIONS; CRYSTALLINE STRUCTURE; HEATING AND COOLING; STARTING POWDERS; THERMAL EVOLUTION; THIN LAYERS;

RUTHENIUM COMPOUNDS;

EID: 84862622027 PISSN: 09253467 EISSN: None Source Type: Journal
DOI: 10.1016/j.optmat.2012.02.048 Document Type: Conference Paper

Times cited : (5)

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