Regime change: Bit-depth versus measurement-rate in compressive sensing

IEEE Transactions on Signal Processing

Volumn 60, Issue 7, 2012, Pages 3496-3505

  Laska, Jason N ^a   Baraniuk, Richard G ^b  

^a Dropcam Inc   (United States)

^b Rice University   (United States)

Author keywords

Analog to digital conversion; compressed sensing; quantization

Indexed keywords

BIT DEPTH; COMPRESSIVE SENSING; DIGITAL SIGNALS; FINITE ALPHABET; HIGH SNR; LOW SNR; NYQUIST RATE; POTENTIAL APPLICATIONS; QUANTIZATION; SIGNAL COMPLEXITY; SIGNAL STRUCTURES; SIGNALTONOISE RATIO (SNR);

MERGERS AND ACQUISITIONS; SIGNAL RECONSTRUCTION;

MEASUREMENTS;

EID: 84862605117     PISSN: 1053587X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSP.2012.2194710     Document Type: Article

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