Three-dimensional analysis of micro defect morphologies in cement-based materials using focused ion beam tomography

Science China Technological Sciences

Volumn 55, Issue 6, 2012, Pages 1539-1544

  Wan, Keshu ^a,b   Sun, Wei ^a,b   Tang, Chunkai ^a,b   Rong, Zhidan ^a,b  

^a Jiangsu Key Laboratory of Construction Materials   (China)

^b SOUTHEAST UNIVERSITY   (China)

Author keywords

cement based materials; crack; focused ion beam (FIB); microstructure; tomography

Indexed keywords

CEMENTS; FOCUSED ION BEAMS; IONS; MICROSTRUCTURE; OPTICAL DATA PROCESSING; TOMOGRAPHY;

CEMENT BASED MATERIAL; FOCUSED ION BEAM TOMOGRAPHIES; OPTICAL AND ELECTRON MICROSCOPIES; SAMPLE PREPARATION; SUBSURFACE CRACKS; THREE-DIMENSIONAL ANALYSIS; THREEDIMENSIONAL (3-D); TWO-DIMENSIONAL (2D) IMAGING;

CRACKS;

EID: 84862529465     PISSN: 16747321     EISSN: 18691900     Source Type: Journal    
DOI: 10.1007/s11431-012-4780-2     Document Type: Article

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