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Volumn 8430, Issue , 2012, Pages

Application of linear systems theory to characterize coherence scanning interferometry

Author keywords

coherence scanning interferometry; inverse filter; point spread function; three dimensional linear filtering theory; transfer function

Indexed keywords

FREQUENCY DOMAINS; INTERFEROGRAMS; INVERSE FILTERS; LINEAR FILTERING; LINEAR FILTERING THEORY; SCANNING INTERFEROMETERS; SPACE DOMAIN;

EID: 84862301307     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.922435     Document Type: Conference Paper
Times cited : (24)

References (12)
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  • 2
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  • 4
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    • Surface measurement errors using commercial scanning white light interferometers
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  • 6
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    • Determination of the metrological characteristics of optical surface topography measuring instruments
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    • Leach, R. K., Giusca, C. L, "Determination of the metrological characteristics of optical surface topography measuring instruments", Proc. SPIE (see these proceedings)
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  • 7
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    • Leach, R. K., Giusca, C. L., Coupland, J. M., "Advances in calibration methods for micro- to nanoscale surfaces", Proc. SPIE (see these proceedings)
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    • Coupland, J.M.1    Lobera, J.2
  • 9
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    • A Linear model of fringe generation and analysis in coherence scanning interferometry
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    • Imaging of spheres with confocal scanning optical microscope
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    • Surface profiling by analysis of white-light interferograms in the spatial frequency domain
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.