Near-normal incidence dark-field microscopy: Applications to nanoplasmonic spectroscopy

Nano Letters

Volumn 12, Issue 6, 2012, Pages 2817-2821

  Fan, Jonathan A ^a,b   Bao, Kui ^c   Lassiter, J Britt ^c   Bao, Jiming ^d   Halas, Naomi J ^c   Nordlander, Peter ^c   Capasso, Federico ^b  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^b HARVARD UNIVERSITY   (United States)

^c RICE UNIVERSITY   (United States)

^d UNIVERSITY OF HOUSTON   (United States)

Author keywords

Dark field; Fano resonance; nanoplasmonics; nanoshell; polarization; spectroscopy

Indexed keywords

BACKGROUND NOISE; CHEMICAL PROCESS; DARK FIELD; DARK FIELD MICROSCOPY; FANO RESONANCES; FIELD EFFECTS; GOLD NANOSHELLS; HEPTAMERS; INCIDENCE ANGLES; LINE SHAPE; NANOPLASMONICS; NANOSHELL; PLASMONIC NANOSTRUCTURES; SCATTERED LIGHT; SIGNAL-TO-BACKGROUND RATIO; SPECTROSCOPIC CHARACTERIZATION;

NANOSHELLS; NANOSTRUCTURED MATERIALS; POLARIZATION; SPECTROSCOPIC ANALYSIS; SPECTROSCOPY;

NANOSTRUCTURES;

NANOMATERIAL;

ARTICLE; CHEMISTRY; MATERIALS TESTING; METHODOLOGY; MICROSCOPY; SPECTROSCOPY; SURFACE PLASMON RESONANCE; ULTRASTRUCTURE;

MATERIALS TESTING; MICROSCOPY; NANOSTRUCTURES; SPECTRUM ANALYSIS; SURFACE PLASMON RESONANCE;

EID: 84862270019     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl300160y     Document Type: Article

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