X-ray diffraction imaging with the Multiple Inverse Fan Beam topology: Principles, performance and potential for security screening

Applied Radiation and Isotopes

Volumn 70, Issue 7, 2012, Pages 1228-1237

  Harding, G ^a   Fleckenstein, H ^a   Kosciesza, D ^a   Olesinski, S ^a   Strecker, H ^a   Theedt, T ^a   Zienert, G ^a  

^a Morpho Detection Germany GmbH   (Germany)

Author keywords

Cargo screening; Carry on baggage; False alarm reduction; Hold baggage; Security screening; X ray diffraction

Indexed keywords

BAGGAGE SCREENING; CARGO SCREENING; CARRY-ON BAGGAGE; DIFFRACTION PROFILES; EXPLOSIVE DETECTION; FALSE ALARMS; FALSE-ALARM RATES; FAN BEAMS; GERMANY; HOLD BAGGAGE; IN-SITU; MULTIPLE FEATURES; RADIATION SOURCE; ROOM TEMPERATURE; SECURITY SCREENING; SECURITY SCREENING EQUIPMENT; SOLID EXPLOSIVES; X-RAY DIFFRACTION IMAGING; XRD;

COST REDUCTION; EXPLOSIVES DETECTION; QUANTUM OPTICS; TOPOLOGY;

X RAY DIFFRACTION;

EXPLOSIVE;

ACCURACY; ARTICLE; COLLIMATOR; COST CONTROL; EQUIPMENT DESIGN; IMAGING AND DISPLAY; INTERMETHOD COMPARISON; MULTIPLE INVERSE FAN BEAM; PRIORITY JOURNAL; RADIATION BEAM; ROOM TEMPERATURE; SAFETY; SECURITY SCREENING; SENSITIVITY ANALYSIS; THREAT; X RAY DIFFRACTION;

EID: 84862215362     PISSN: 09698043     EISSN: 18729800     Source Type: Journal    
DOI: 10.1016/j.apradiso.2011.12.015     Document Type: Article

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